Gelişmiş Arama

Basit öğe kaydını göster

dc.contributor.authorIşık, Mehmet
dc.contributor.authorGüllü, Hasan Hüseyin
dc.contributor.authorDelice, Serdar
dc.contributor.authorGasanly, Nizami Mamed
dc.contributor.authorParlak, Mehmet
dc.date.accessioned2019-05-13T08:58:24Z
dc.date.available2019-05-13T08:58:24Z
dc.date.issued2019
dc.identifier.citationIsik, M., Gullu, H. H., Delice, S., Gasanly, N. M., & Parlak, M. (2019). Analysis of temperature-dependent transmittance spectra of Zn 0.5 In 0.5 Se (ZIS) thin films. Journal of Materials Science: Materials in Electronics, 30(10), 9356-9362.en_US
dc.identifier.issn0957-4522
dc.identifier.urihttps://doi.org/10.1007/s10854-019-01265-5
dc.identifier.urihttps://hdl.handle.net/11491/1129
dc.description.abstractTemperature-dependent transmission experiments of ZnInSe thin films deposited by thermal evaporation method were performed in the spectral range of 550–950 nm and in temperature range of 10–300 K. Transmission spectra shifted towards higher wavelengths (lower energies) with increasing temperature. Transmission data were analyzed using Tauc relation and derivative spectroscopy. Analysis with Tauc relation was resulted in three different energy levels for the room temperature band gap values of material as 1.594, 1.735 and 1.830 eV. The spectrum of first wavelength derivative of transmittance exhibited two maxima positions at 1.632 and 1.814 eV and one minima around 1.741 eV. The determined energies from both methods were in good agreement with each other. The presence of three band gap energy levels were associated to valence band splitting due to crystal-field and spin–orbit splitting. Temperature dependence of the band gap energies were also analyzed using Varshni relation and gap energy value at absolute zero and the rate of change of gap energy with temperature were determined. © 2019, Springer Science+Business Media, LLC, part of Springer Nature.en_US
dc.language.isoeng
dc.publisherSpringer New York LLCen_US
dc.relation.isversionof10.1007/s10854-019-01265-5en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subject[Belirlenecek]en_US
dc.titleAnalysis of temperature-dependent transmittance spectra of Zn0.5In0.5Se (ZIS) thin filmsen_US
dc.typearticleen_US
dc.relation.journalJournal of Materials Science: Materials in Electronicsen_US
dc.departmentHitit Üniversitesi, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.authorid0000-0001-5409-6528en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


Bu öğenin dosyaları:

DosyalarBoyutBiçimGöster

Bu öğe ile ilişkili dosya yok.

Bu öğe aşağıdaki koleksiyon(lar)da görünmektedir.

Basit öğe kaydını göster