Ara
Toplam kayıt 391, listelenen: 391-391
Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry
(Elsevier, 2020)
Structural and optical characteristics of Bi12SiO20 single crystal grown by the Czochralski method were investigated by virtue of X-ray diffraction (XRD) and spectroscopic ellipsometry measurements. XRD analysis indicated ...