Analysis of temperature-dependent transmittance spectra of Zn0.5In0.5Se (ZIS) thin films

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dc.authorid0000-0001-5409-6528
dc.contributor.authorIşık, Mehmet
dc.contributor.authorGüllü, Hasan Hüseyin
dc.contributor.authorDelice, Serdar
dc.contributor.authorGasanly, Nizami Mamed
dc.contributor.authorParlak, Mehmet
dc.date.accessioned2019-05-13T08:58:24Z
dc.date.available2019-05-13T08:58:24Z
dc.date.issued2019
dc.departmentHitit Üniversitesi, Fen Edebiyat Fakültesi, Fizik Bölümü
dc.description.abstractTemperature-dependent transmission experiments of ZnInSe thin films deposited by thermal evaporation method were performed in the spectral range of 550–950 nm and in temperature range of 10–300 K. Transmission spectra shifted towards higher wavelengths (lower energies) with increasing temperature. Transmission data were analyzed using Tauc relation and derivative spectroscopy. Analysis with Tauc relation was resulted in three different energy levels for the room temperature band gap values of material as 1.594, 1.735 and 1.830 eV. The spectrum of first wavelength derivative of transmittance exhibited two maxima positions at 1.632 and 1.814 eV and one minima around 1.741 eV. The determined energies from both methods were in good agreement with each other. The presence of three band gap energy levels were associated to valence band splitting due to crystal-field and spin–orbit splitting. Temperature dependence of the band gap energies were also analyzed using Varshni relation and gap energy value at absolute zero and the rate of change of gap energy with temperature were determined. © 2019, Springer Science+Business Media, LLC, part of Springer Nature.
dc.identifier.citationIsik, M., Gullu, H. H., Delice, S., Gasanly, N. M., & Parlak, M. (2019). Analysis of temperature-dependent transmittance spectra of Zn 0.5 In 0.5 Se (ZIS) thin films. Journal of Materials Science: Materials in Electronics, 30(10), 9356-9362.
dc.identifier.doi10.1007/s10854-019-01265-5
dc.identifier.issn0957-4522
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1007/s10854-019-01265-5
dc.identifier.urihttps://hdl.handle.net/11491/1129
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer New York LLC
dc.relation.ispartofJournal of Materials Science: Materials in Electronics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subject[Belirlenecek]en_US
dc.titleAnalysis of temperature-dependent transmittance spectra of Zn0.5In0.5Se (ZIS) thin films
dc.typeArticle

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