Dielectric characterization of Al/PCBM:ZnO/p-Si structures for wide-range frequency

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dc.authoridYıldırım, Murat / 0000-0002-4541-3752
dc.contributor.authorYıldız, Dilber Esra
dc.contributor.authorKoçyiğit, Adem
dc.contributor.authorErdal, Mehmet Okan
dc.contributor.authorYıldırım, Murat
dc.date.accessioned2021-11-01T15:05:58Z
dc.date.available2021-11-01T15:05:58Z
dc.date.issued2021
dc.departmentHitit Üniversitesi, Fen Edebiyat Fakültesi, Fizik Bölümü
dc.description.abstractThe dielectric properties of the Al/PCBM:ZnO/p-Si structure were investigated using the impedance spectroscopy technique. PCBM:ZnO layer was obtained by spin coating method on the p-Si. The morphological properties of the PCBM:ZnO were investigated using atomic force microscopy. The results highlighted that PCBM:ZnO thin film has uniform surfaces. The dielectric parameters such as real and imaginary parts of the electric modulus (M ' and M '') and ac electrical conductivity (sigma), dielectric constant (epsilon '), dielectric loss (epsilon ''), loss tangent (tan delta) values were determined. The results of the dielectric properties of the Al/PCBM:ZnO/p-Si structures impressed voltage and frequency changing. The Al/PCBM:ZnO/p-Si structures can be regarded as a candidate for organic diode applications.
dc.description.sponsorshipSelcuk University BAP OfficeSelcuk University [19401034]; Hitit University BAP OfficeHitit University [FEF.19004.15.010, FEF01.13.003]en_US
dc.description.sponsorshipThis study was supported by Selcuk University BAP Office under Project Number 19401034 and Hitit University BAP Office under Project Numbers FEF.19004.15.010 and FEF01.13.003.en_US
dc.identifier.citationYildiz, D. E., Kocyigit, A., Erdal, M. O., & Yildirim, M. (2021). Dielectric characterization of Al/PCBM: ZnO/p-Si structures for wide-range frequency. Bulletin of Materials Science, 44(1), 1-7.
dc.identifier.doi10.1007/s12034-020-02297-y
dc.identifier.issn0250-4707
dc.identifier.issn0973-7669
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85100549063
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1007/s12034-020-02297-y
dc.identifier.urihttps://hdl.handle.net/11491/7457
dc.identifier.volume44en_US
dc.identifier.wosWOS:000617476200011
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorYıldız, Dilber Esra
dc.language.isoen
dc.publisherIndian Acad Sciences
dc.relation.ispartofBulletin Of Materials Science
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectPCBMen_US
dc.subjectZnOen_US
dc.subjectDielectric constanten_US
dc.subjectElectric modulusen_US
dc.subjectAl/PCBM:ZnO/p-Si structureen_US
dc.titleDielectric characterization of Al/PCBM:ZnO/p-Si structures for wide-range frequency
dc.typeArticle

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