Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry
[ X ]
Tarih
2020
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Elsevier
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
Structural and optical characteristics of Bi12SiO20 single crystal grown by the Czochralski method were investigated by virtue of X-ray diffraction (XRD) and spectroscopic ellipsometry measurements. XRD analysis indicated that the studied crystal possesses cubic structure with lattice parameters of a = 1.0107 nm. Spectral dependencies of several optical parameters like complex dielectric constant, refractive index, extinction and absorption coefficients were determined using ellipsometry experiments performed in the energy region of 1.2-6.2 eV. The energy band gap of Bi12SiO20 crystals was found to be 3.25 eV by utilizing absorption coefficient analysis. Moreover, critical point energies were calculated as 3.54, 4.02, 4.82 and 5.58 eV from analyses of the second energy derivative spectra of the complex dielectric constant.
Açıklama
Anahtar Kelimeler
Sillenites, Ellipsometry, Optical properties, Critical points
Kaynak
Materials Science In Semiconductor Processing
WoS Q Değeri
Q1
Scopus Q Değeri
Q1
Cilt
120
Sayı
Künye
Işık, M., Delice, S., Nasser, H., Gasanly, N. M., Darvishov, N. H., Bagiev, V. E. (2020). Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry. Materials Science In Semiconductor Processing. 120.
