Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry

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dc.authorid0000-0001-5409-6528
dc.contributor.authorIşık, Mehmet
dc.contributor.authorDelice, Serdar
dc.contributor.authorNasser, H.
dc.contributor.authorGasanly, Nizami Mamed
dc.contributor.authorDarvishov, N. H.
dc.contributor.authorBagiev, V. E.
dc.date.accessioned2021-11-01T15:05:15Z
dc.date.available2021-11-01T15:05:15Z
dc.date.issued2020
dc.departmentHitit Üniversitesi, Fen Edebiyat Fakültesi, Fizik Bölümü
dc.description.abstractStructural and optical characteristics of Bi12SiO20 single crystal grown by the Czochralski method were investigated by virtue of X-ray diffraction (XRD) and spectroscopic ellipsometry measurements. XRD analysis indicated that the studied crystal possesses cubic structure with lattice parameters of a = 1.0107 nm. Spectral dependencies of several optical parameters like complex dielectric constant, refractive index, extinction and absorption coefficients were determined using ellipsometry experiments performed in the energy region of 1.2-6.2 eV. The energy band gap of Bi12SiO20 crystals was found to be 3.25 eV by utilizing absorption coefficient analysis. Moreover, critical point energies were calculated as 3.54, 4.02, 4.82 and 5.58 eV from analyses of the second energy derivative spectra of the complex dielectric constant.
dc.description.sponsorshipAtilim UniversityAtilim University [ATUADP-1920-03]en_US
dc.description.sponsorshipThis work was supported by Atilim University under Grant No: ATUADP-1920-03.en_US
dc.identifier.citationIşık, M., Delice, S., Nasser, H., Gasanly, N. M., Darvishov, N. H., Bagiev, V. E. (2020). Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry. Materials Science In Semiconductor Processing. 120.
dc.identifier.doi10.1016/j.mssp.2020.105286
dc.identifier.issn1369-8001
dc.identifier.issn1873-4081
dc.identifier.scopus2-s2.0-85088630853
dc.identifier.scopusqualityQ1
dc.identifier.urihttps://doi.org/10.1016/j.mssp.2020.105286
dc.identifier.urihttps://hdl.handle.net/11491/7193
dc.identifier.volume120en_US
dc.identifier.wosWOS:000571889900005
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier
dc.relation.ispartofMaterials Science In Semiconductor Processing
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectSillenitesen_US
dc.subjectEllipsometryen_US
dc.subjectOptical propertiesen_US
dc.subjectCritical pointsen_US
dc.titleOptical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry
dc.typeArticle

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